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NIKON X-RAY AND CT INSPECTION

Nikon Metrology manufactures X-ray and Computed Tomography (CT) inspection systems that get the inside picture of complex industrial parts, by looking into the internal structure. The CT capability is used to qualify and quantify any inner or outer dimension in a smooth, non-destructive process. X-ray electronics inspection systems respond to a growing demand for flexible, detailed and affordable inspection to cope with the demands of ever-smaller electrical components and comply with tighter quality standards.

Nikon X-Ray and CT Inspection

Computed Tomography

XT H 225 Industrial CT Scanning

Nikon XTH225 CT

The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.

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XT H 225 ST Industrial CT Scanning

Nikon XTH225 ST CT

The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.

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XT H 320 for X-ray and CT inspection of larger samples

Nikon XTH320 CT

The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span.

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XT H 450 for turbine blade and casting inspection

Nikon XTH450 CT

The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy. The system is available with a flat panel or a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

This linear detector realizes stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. 450kV and the CLA are ideal for the inspection of small to medium metal alloy turbine blades and casted parts.

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Metrology CT

MCT225 for Metrology CT: Absolute accuracy for inside geometry

Nikon MCT225 Metrology-CT

This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently. A proprietary liquid cooled micro-focus reflection source and air-cooled cabinet provide long-term stability and enable the MCT225 to achieve an impressive accuracy specification. It offers superior measuring accuracy and small feature detection to inspect precision plastic parts, small castings and complex parts and assemblies.

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Configurable X-ray / CT Systems

Nikon Metrology’s configurable X-ray/CT systems offer a larger inspection envelope than available in the standard Nikon cabinet products. These modular systems support multiple sources, multiple detectors and can be custom-configured to fit a variety of applications. Configurable CT systems can be built into (existing ) cabinets or walk-in rooms. As such you can configure your X-ray / CT facilities to your needs or upgrade existing facilities with the latest X-ray/CT technology.

Nikon Metrology partners with Avonix Imaging who supplies different sized frames and manipulators. The core of these configurable systems are the Nikon in house-built microfocus sources of 160 kV, 225 kV, 320 kV, and 450 kV. The focal spot size of these microfocus sources is orders-of-magnitude smaller when compared to minifocus sources, which results in superior resolution and accuracy. The larger source offer sufficient X-ray energy to penetrate dense or larger parts.

M1 Configurable X-Ray/CT Inspection System

Nikon M1 Configurable X-Ray/CT Inspection System

The M1 system is an economical, large-envelope modular inspection system. The perimeter frame and cantilevered sample stage allows for free and clear access around the sample stage for ease of sample setup.

Supporting sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with flat-panel detector technology and Nikon micro focus sources.

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M2 high-precision X-ray CT inspection system

Nikon M2 high-precision X-ray CT inspection system

The M2 system is a high-precision large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 8 axis manipulator.

Supporting dual sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Diode Array (CLDA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The M2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.

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C2 Extra large-envelope X-ray/CT inspection system

Nikon C2 Extra large-envelope X-ray/CT inspection system

The C2 platform is a high-precision, extra large-envelope modular inspection system. The metrology-grade granite base provides the foundation for the patented ultra-precise and stable 7-axis manipulator.

Supporting dual sources up to 450kV offers the necessary power to penetrate through high-density parts and generate scatter-free CT volumes with micron accuracy. The system is available with a flat panel detector and a proprietary Curved Linear Array (CLA) detector that optimizes the collection of the X-rays without capturing the undesired scattered X-rays.

The linear detector produces stunning image sharpness and contrast by avoiding image pollution and associated contrast reduction. The C2 is ideal for the inspection of parts ranging in size from small, low-density samples to large, high-density materials.

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X-ray systems for electronics inspection

XT V 130C - Cost-effective X-ray inspection of electronic components

Nikon XT V 130C Electronics X-ray system

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130kv/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

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XT V 160 - High-quality PCB inspection system

Nikon XT V 160 Electronics X-ray system

The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control the 5-axis sample manipulator. Real-time X-ray allows them to intuitively navigate complex printed circuit boards and electronic components and quickly trace defects. In automated inspection mode, samples can be inspected at highest throughput.

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Case Study In-process x-ray inspection improves quality control of circuit boardspdf_link

XT V 160 NF Nanofocus X-ray inspection

Nikon XT V 160 NF Nanofocus X-ray inspection

XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today. As such, the XT V 160 NF is indispensable for any electronics development and production environment.

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Software

Inspect-X for electronics inspection

Nikon Inspect-X for electronics inspection

Inspect-X has been designed around the user experience, resulting in intuitive and productive X-ray inspection. Inspect-X features user friendly wizards to guide users through complex inspections, as well as utilizing the most advanced visualization and analysis function capabilities. XT V systems with Inspect-X enable rapid deployment of new product lines, within minutes, rather than hours or days.

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X.Tract - See more

Nikon X.Tract software for CT

X.Tract provides CT-quality inspection results of complex, multilayer electronics assemblies without slicing the board. In a rapid and user friendly process, it creates virtual microsections in any direction in the region-of-interest. X.Tract reveals defects that are obscured in 2D X-ray images of layered components.

The new X.Tract tool provides, fully automated acquisition, powerful image processing and detailed reporting. With X.Tract, users gain better insight into complex packages such as Package on Package (PoP) or dual-layered boards leading to reduced false call rates and higher productivity.

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Higher resolution and faster: X.Tend your CT scanning capability

Nikon X.Tend software for CT

In comparison to conventional circular CT scanning, X.Tend is a CT acquisition method that allows customers to extend the height of their CT scan by moving the tall sample up through the X-ray cone-beam as the sample rotates. X.Tend eliminates the need to have partial scans of a sample that are stitched back together afterwards.

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Sources

X-ray sources: In-house design and build

Nikon X-ray sources

Nikon Metrology X-ray sources are at the heart of our technology and have been designed and manufactured in-house from 1987 to this day; offering over 25 years of knowledge. Being at the heart of the image, control over the X-ray source technology allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. All sources are open-tube giving a low cost of ownership and range from low (160) to medium (225) to high (750) kV, all with micron resolution.

180 kV transmission target

Applicable for samples smaller than 10 mm, such as small rock cores or bone samples, the Transmission Target operates up to 180 kV to achieving a minimum spot size of 1 µm leading to high resolution CT.

225 kV ultrafocus and rotating targets

With up to 225 kV and a minimum spot size of 3 µm, the 225 kV microfocus source is the core of Nikon’s XT H 225 range, devising flexibility to cope with a range of sample sizes and densities.

Nikon Metrology is the only company to produce an Industrial 225 kV microfocus rotating target. Using a rotating target, the electron beam falls on a moving instead of a fixed surface, which yields much more effective cooling. This offers the opportunity to measure objects faster, or denser objects with higher accuracy than using a conventional static 225 kV.

320 kV source

The 320 kV source is a unique microfocus source for samples too large or dense for 225 kV whilst still maintaining a small spot size. Ideal for rock cores and small castings the source is an option in the XT H 320 cabinet.

450 kV static and high brilliance source

The unique 450 kV microfocus source gives industry leading performance for small high density or small to medium castings with unrivalled power and resolution. Nikon’s 450 kV high-brilliance source delivers 450 W continuous power, without any measurement time restriction, whilst maintaining a smaller spot size for faster CT scanning, collecting data up to 5x faster or with higher accuracy in a similar scan duration of the default 450 kV.

750 kV microfocus X-ray source

Nikon 750 kV microfocus X-ray source

The 750 kV X-ray source with micron level spot size enables non-destructive inspection or measurement of large or dense objects such as engine castings, turbine blades, large composite parts with unprecedented resolution. It is the only 750 kV microfocus source on the market providing superior resolution and accuracy compared to traditional minifocus sources.

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Nikon on johtava optisten instrumenttien valmistaja. Yhtiö on perustettu Japanissa vuonna 1917. Yli 90-vuotisen toimintansa aikana Nikon on kehittänyt edistyneitä ja tinkimättömän laadukkaita mikroskooppeja ja muita optisia laitteita.
Tänä päivänä Nikon Metrology tarjoaa laajan tuotevalikoiman mikroskopia- ja mittalaitteissa.
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