NIS-Elements on integroitu mikroskooppikuvantamisohjelmisto, joka lisää mikroskooppityöskentelyyn tehokkaat ja kehittyneet välineet mikroskoopin ohjaamiseen, kuvan ottamiseen, analysointiin, dokumentointiin, raportointiin ja arkistointiin.
Ohjelmiston intuitiivinen käyttöliittymä yksinkertaistaa työnkulkua ja nopeuttaa kuvien käsittelyaikaa tarjoten samalla tehokkaita ominaisuuksia, kuten kuvien liittäminen (image stitching), kohteiden laskenta (object counting) ja 3D-kuvien rekonstruoiminen ja luominen kerroskuvista (EDF).
NIS-Elements -ohjelmistoperhe koostuu useammasta eritasoisesta ohjelmistopaketista, joihin on koottu erityyppisten sovellusten vaatimat ominaisuudet.
|NIS-Elements Ar (Advanced Research)|
NIS-Elements AR is optimized for advanced research applications. It features fully automated acquisition and device control through full six-dimensional image acquisition and analysis.
The software is designed to deliver power and maximize workflow. It handles multi-dimensional imaging flawlessly, with support for capture, display, peripheral device control and data management and analysis of up to six dimensions (X,Y,Z,Lambda(wavelength),T, multi stage points). It also offers sophisticated image processing and visualization features, such as a 5D viewer, automated object counting, intensity measurements over time, image stitching, deconvolution, databasing and Extended Depth of Focus functions.
|NIS-Elements Br (Basic Research)|
NIS-Elements BR is suited for standard research applications such as analysis and photodocumentation of fluorescent imaging. It features up to four dimensional acquisition capabilities and advanced device control capabilities.
BR handles multi-dimensional imaging with ease, with support for capture, display, peripheral device control, and data management and analysis of up to four dimensions (for example: X,Y,Z, Lambda (wavelength)). It also provides advanced image processing features, such as automated image count, intensity over time, database capabilities and report generation and Extended Depth of Focus functions.
|NIS-Elements D (Documentation)|
NIS-Elements Documentation is tailored for facilitating image capture, object measurement and counting, databasing and report generation. Ease of use and simplification of menu options has been emphasized in the design of the package while also displaying a similiar look and feel in NIS-Elements Advanced Research (AR) and Basic Research packages.
The combination of integrated automated intelligence, streamlined workflow, attention to detail and creative design makes NIS-Elements Documentation the perfect package for clinical and industrial applications such as tissue comparison, image archiving and reporting, particle analysis, defect analysis and fiber & textile material analysis.
Core documentation functionality includes manual length and area measurements, large imaging stitching optional modules are available: database for streamlined image filing, retrival and report generation for PDF based reports, Extended Depth of Focus (EDF), which creates an all-in-focus image from a series of Z-axis images, live compare for comparing a live image with a static image or overlay, AutoMeasure for automated object counting using thresholding, feature restrictions and data export, and advanced macro builder for more complex custom programming.
Katso vertailutaulukko eri ohjelmaversioiden ominaisuuksista NIS Elements -esitteestä
NIS-Elements AR, BR and D packages offer the user the choice to add one dimension for image capture, Z-motor control for a Z-series, stage control for multiple stage positions (ideal for large image stitching) or a time-lapse to observe any changes over time. One can be utilized at a time, but all three additional dimensions are available.
The Live Compare module (AR, option for BR and D) is ideal for comparing a live image with a stored image for applications such as defect analysis, Go-No-Go assessment and more. Viewing of a stored image and a live image can be displayed in various formats.
Multidimensional Capturing (option for AR, BR): NIS-Elements can combine X, Y, Z, Lambda (wavelength), Time, and Multi Stage Points within one integrated platform for multi-dimensional imaging (depends on the capability of the software). All combinations of multidimensional images can be linked together in one ND2 file sequence using an efficient workflow and intuitive GUI.
NIS-Elements includes impressive large image stitching capabilities. Here's how it works: samples are scanned automatically using a motorized XY stage with auto-focus capability and captured images are stitched into one large image. Special algorithms ensure maximum accuracy, resulting in ultra high-resolution images.
With NIS-Elements image processing tools, it is possible to modify image display and feature extraction using various filters for, for example, sharpness, smoothing and detection.
Extended Depth of Focus (EDF) is an additional software plug-in for NIS-Elements. Thanks to the EDF function, images that have been captured in a different Z-axis can be combined to create an all-in-focus image. Also, it is possible to create stereovision image & 3D surface image for a virtual 3D image.
Interactive Measurement (AR+BR+D) allows easy measurement of length and area by drawing lines or an object directly on the image. The results can be attached to the image, and also exported as text or to an Excel spreadsheet. Annotations such as arrows, circles, squares, text are also available display options.
Auto Measurement (Object Counting, AR+BR, option for D) measures the number of area of objects which are extracted from images by the creation of a binary layer through thresholding using RGB/HIS or intensity values. The results can be listed or exported as text or an excel file. It is possible to sae and reuse thresholding parameters.
Report Generator enables the user to create customized reports containing images, database descriptions, measured data, user texts, and graphics. PDF format files can be created directly from NIS-Elements.